[MTD] [NAND] fix broken debug messages
Fix incorrect debug messages (*write* not read); someone committed some cut'n'paste bugs. There might be more, I only noticed these since I was looking for nand_read usage and landed in some very wrong functions. IMO all MTD debugging message framework is goofed, anyway. It uses "DEBUG" in a way that's incompatible with usage most everywhere else in the kernel, and which prevents normal pr_dbg() and dev_dbg() calls from working right. [True. It predates those by a long way, and should probably be updated to use them. dwmw2] Signed-off-by: David Brownell <dbrownell@users.sourceforge.net> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This commit is contained in:
parent
ff4569c752
commit
374555aeb6
1 changed files with 4 additions and 4 deletions
|
@ -1946,7 +1946,7 @@ static int nand_do_write_oob(struct mtd_info *mtd, loff_t to,
|
|||
}
|
||||
|
||||
if (unlikely(ops->ooboffs >= len)) {
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_read_oob: "
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_do_write_oob: "
|
||||
"Attempt to start write outside oob\n");
|
||||
return -EINVAL;
|
||||
}
|
||||
|
@ -1956,7 +1956,7 @@ static int nand_do_write_oob(struct mtd_info *mtd, loff_t to,
|
|||
ops->ooboffs + ops->ooblen >
|
||||
((mtd->size >> chip->page_shift) -
|
||||
(to >> chip->page_shift)) * len)) {
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_read_oob: "
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_do_write_oob: "
|
||||
"Attempt write beyond end of device\n");
|
||||
return -EINVAL;
|
||||
}
|
||||
|
@ -2012,8 +2012,8 @@ static int nand_write_oob(struct mtd_info *mtd, loff_t to,
|
|||
|
||||
/* Do not allow writes past end of device */
|
||||
if (ops->datbuf && (to + ops->len) > mtd->size) {
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_read_oob: "
|
||||
"Attempt read beyond end of device\n");
|
||||
DEBUG(MTD_DEBUG_LEVEL0, "nand_write_oob: "
|
||||
"Attempt write beyond end of device\n");
|
||||
return -EINVAL;
|
||||
}
|
||||
|
||||
|
|
Loading…
Reference in a new issue